Position Paper: Building a better set-up starting with the interconnect
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The test harness is a critical element of ATE which can be simplified and improved with a reliable and robust Zero Insertion Force (ZIF) style connector.
Download this position paper from ITT Cannon to learn...
- Why ZIF connectors are ideal for ATE applications.
- Why Hertz Stress is a critical determinant of connector quality.
- How ITT Cannon's DL range delivers maximum flexibility.
From semiconductor testing, to ECUs and avoinics testing there is a Cannon interconnect solution that can deliver to your requirements. Download today to learn more.