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Position Paper: Building a better set-up starting with the interconnect

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The test harness is a critical element of ATE which can be simplified and improved with a reliable and robust Zero Insertion Force (ZIF) style connector.

Download this position paper from ITT Cannon to learn...

Why ZIF connectors are ideal for ATE applications.
Why Hertz Stress is a critical determinant of connector quality.
How ITT Cannon's DL range delivers maximum flexibility.

From semiconductor testing, to ECUs and avoinics testing there is a Cannon interconnect solution that can deliver to your requirements. Download today to learn more.

Complete the form to download the position paper and learn how DL connectors can complement your ATE applications.

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